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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
Mengwei Si1, Yaoqiao Hu2, Zehao Lin1
1School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, United States.
We demonstrate thin amorphous Indium Oxide (In2O3) transistors using atomic layer deposition. Controlling In2O3 thickness tunes electrical properties for advanced electronics.
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