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The five-analyzer point-to-point scanning crystal spectrometer at ESRF ID26
Pieter Glatzel1, Alistair Harris2, Philippe Marion1
1ESRF - The European Synchrotron, 71 Avenue des Martyres, 38000 Grenoble, France.
Journal of Synchrotron Radiation
|January 5, 2021
Summary
Designing X-ray emission spectroscopy instruments with multiple analyzer crystals is complex. This study details component positioning and ray-tracing methods to optimize mechanical design and minimize energy broadening for improved performance.
Area of Science:
- Spectroscopy
- Materials Science
- Analytical Chemistry
Background:
- X-ray emission spectroscopy (XES) instruments with multiple analyzer crystals present significant mechanical design and performance challenges.
- Achieving point-to-point focusing in such setups requires precise component alignment and positioning.
Purpose of the Study:
- To discuss various component positioning options for multi-analyzer crystal XES instruments.
- To provide formulas for calculating the relative placement of instrument components.
- To analyze geometrical contributions to energy broadening in XES.
Main Methods:
- Development of formulas for component placement in multi-analyzer crystal XES.
- Utilization of ray-tracing calculations to model geometrical effects on energy broadening.
- Detailed description of instrument alignment procedures.
Main Results:
- Identification of optimal component positioning strategies for improved XES performance.
- Quantification of energy broadening contributions from source volume and beam footprint.
- Demonstration of instrument alignment techniques.
Conclusions:
- Effective mechanical design and precise component placement are crucial for high-performance XES.
- Ray-tracing analysis provides valuable insights into optimizing geometrical factors affecting energy resolution.
- The presented methods and alignment strategies can enhance the capabilities of multi-analyzer crystal XES instruments.
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