The effect of secondary capping on the control of phosphorus release from sediment by activated thin-layer capping...

It is well-known that the activated thin-layer capping covering by secondary capping of contaminated sediment poses a threat to the inactivation of activated material. In this study, the static simulation experiment was conducted to study the effect of secondary capping thickness by sediment on the control of TP release from the sediment by aluminum-based P-inactivation agent (Al-PIA), and to propose the phosphorus adsorption pathway of Al-PIA. The results showed that Al-PIA could effectively reduce the release of phosphorus pollutants from the sediment at the capping intensity of 2 kg/m². When the secondary capping thickness of sediment were 0, 2, 4, 7, 10, and 15 mm, the average removal rates of TP were 87.57%, 76.39%, 61.22%, 51.32%, 41.93%, and 32.11%, respectively, indicating that the removal efficiency of phosphorus decreased with the increase of the secondary capping thickness of the sediment. The adsorbed phosphorus by Al-PIA was mainly non-apatite inorganic phosphorus (NAIP) in inorganic phosphorus. With the increase of the secondary capping thickness of sediment, the NAIP proportion of phosphorus adsorbed by Al-PIA increased. Meanwhile, the removal rate of phosphorus in the activated capping system showed a first increase and then decrease trend, and the removal rates of total phosphorus (TP), inorganic phosphorus (IP), and organic phosphorus (OP) were obvious except for that of organic phosphorus (OP).