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Updated: Nov 22, 2025

From Voxels to Knowledge: A Practical Guide to the Segmentation of Complex Electron Microscopy 3D-Data
Published on: August 13, 2014
Eichi Takaya1, Yusuke Takeichi2, Mamiko Ozaki3
1School of Science for Open and Environmental Systems, Graduate School of Science and Technology, Keio University, Kanagawa, Japan.
This study introduces sequential semi-supervised segmentation (4S) for electron microscopy images. The 4S method effectively segments neural regions using limited labeled data and unlabeled data, outperforming traditional supervised learning.
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