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Raman Spectroscopy, X-ray Diffraction, and Scanning Electron Microscopy as Noninvasive Methods for Microstructural
Anca E Chiriac1, Doina Azoicai1, Adina Coroaba2
1Faculty of Medicine, "Grigore T. Popa" University of Medicine and Pharmacy, 700115 Iași, Romania.
Molecules (Basel, Switzerland)
|January 12, 2021
Summary
Diagnosing isolated nail psoriasis can be challenging. Raman spectroscopy, alongside scanning electron microscopy and X-ray diffractometry, shows promise as a non-invasive diagnostic tool for nail psoriasis.
Area of Science:
- Dermatology
- Biophysics
- Materials Science
Background:
- Psoriasis is a chronic inflammatory disease impacting quality of life.
- Nail psoriasis, often linked to skin psoriasis, can occur in isolation.
- Current diagnostic methods for isolated nail psoriasis can be invasive or difficult.
Purpose of the Study:
- To evaluate Raman spectroscopy as a diagnostic tool for nail psoriasis.
- To compare Raman spectroscopy findings with scanning electron microscopy (SEM) and X-ray diffractometry.
- To assess the potential of these techniques as non-invasive alternatives for nail psoriasis diagnosis.
Main Methods:
- Raman spectroscopy was used to analyze human fingernails.
- Results were corroborated with scanning electron microscopy (SEM).
- X-ray diffractometry was also employed for structural analysis.
Main Results:
- Raman spectroscopy provided valuable information about nail tissue.
- Corroboration with SEM and X-ray diffractometry confirmed findings.
- The study assessed the diagnostic potential of these structural and morphological techniques.
Conclusions:
- Raman spectroscopy, SEM, and X-ray diffractometry show potential as non-invasive diagnostic tools for nail psoriasis.
- These techniques may offer an alternative to current invasive diagnostic methods.
- Further research can validate their clinical application in dermatology.
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