Analytical Approach to Screen Semiconducting MOFs Using Bloch Mode Analysis and Spectroscopic Measurements

Hemali Rathnayake1, Sujoy Saha1, Sheeba Dawood1

  • 1Department of Nanoscience, Joint School of Nanoscience and Nanoengineering, University of North Carolina at Greensboro, Greensboro, North Carolina 27401, United States.