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Updated: Nov 21, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Carolyn L Hartley1, Melody L Kessler1, Jillian L Dempsey1
1Department of Chemistry, University of North Carolina, Chapel Hill, North Carolina 27599-3290, United States.
Understanding semiconductor nanocrystal surfaces is key to improving device efficiency. Combining experimental and computational methods offers a molecular-level view of these complex nanomaterials.
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