Ferroelectricity in thin films driven by charges accumulated at interfaces

Cristian M Teodorescu1

  • 1National Institute of Materials Physics, Atomiştilor 405A, 07715 Măgurele - Ilfov, Romania. teodorescu@infim.ro.

Summary

This study presents a simplified model for ferroelectric thin films, explaining hysteresis and temperature dependence using basic parameters. The model accurately predicts Curie temperatures and coercive fields, aligning well with experimental data.

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