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    This study introduces optimal procedures to extract scattering features from ultrasonic array imaging data. These methods effectively isolate target scatterers, minimizing noise for improved defect characterization.

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    Area of Science:

    • Materials Science
    • Non-Destructive Testing
    • Acoustic Imaging

    Background:

    • Ultrasonic array imaging is crucial for defect detection and characterization in non-destructive testing.
    • The scattering matrix provides subwavelength defect characterization, surpassing traditional image-based analysis.
    • Scattering coefficients are often contaminated by noise and nearby scatterers, hindering accurate analysis.

    Purpose of the Study:

    • To investigate optimal procedures for extracting scattering features from selected regions of interest in beamformed ultrasonic images.
    • To develop strategies for isolating target scatterers and recovering their exclusive time responses.
    • To enhance the accuracy of defect characterization at the subwavelength scale.

    Main Methods:

    • Implementation of two main strategies for scatterer isolation: delay-and-sum and frequency-wavenumber.
    • Optimization of these strategies to maximize the extraction rate of scattering features.
    • Application of developed procedures to experimental data from polycrystalline materials.

    Main Results:

    • The proposed procedures successfully isolate target scatterers, minimizing the impact of surrounding noise.
    • A rich frequency spectrum of the scattering matrix was recovered for experimental cases.
    • Demonstrated effectiveness in minimizing the effects of scattering noise in polycrystalline materials.

    Conclusions:

    • The developed methods enable the deployment of imaging methods reliant on the scattering matrix.
    • Accurate subwavelength defect characterization is improved by minimizing noise interference.
    • Enhanced defect characterization capabilities for non-destructive testing applications.