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Calculation of effective atomic numbers using a rational polynomial approximation method with a dual-energy X-ray
Chia-Hao Chang1, Yu-Ching Ni1, Sheng-Pin Tseng1
1Health Physics Division, Institute of Nuclear Energy Research, Taoyuan City, Taiwan, R.O.C.
A new rational polynomial approximation method enhances effective atomic number calculations in dual-energy X-ray imaging. This technique improves accuracy for material analysis and explosives detection without increasing computational load.
Area of Science:
- Medical Physics
- Imaging Science
- Materials Science
Background:
- Accurate effective atomic number (Zeff) calculation is crucial for material identification in dual-energy X-ray imaging.
- Conventional polynomial approximation methods have limitations in Zeff calculation accuracy.
- Optimizing Zeff calculation improves the performance of X-ray imaging systems.
Purpose of the Study:
- To develop a novel rational polynomial approximation method for enhanced Zeff calculation accuracy.
- To validate the proposed method using simulated and experimental data.
- To assess the method's applicability in baggage inspection for explosives detection.
Main Methods:
- A multi-materials calibration model with iterative optimization was employed.
- A rational polynomial approximation was introduced to improve Zeff calculation.
- Twelve reference materials (Zeff 5.444–22) were used for model calibration.
- Simulated and experimental studies validated the method's performance.
Main Results:
- The rational polynomial approximation method improved Zeff calculation accuracy by approximately 40% compared to conventional methods.
- Relative differences between calculated and experimental Zeff values were below 8.5% for all samples.
- The method demonstrated compliance with international baggage inspection standards for explosives detection.
- Dual-energy images showed significant contrast for explosives using the proposed method.
Conclusions:
- The proposed rational polynomial approximation method offers a significant improvement in Zeff calculation accuracy for dual-energy X-ray imaging.
- This method enhances material characterization and is suitable for security applications like explosives detection.
- The technique provides a computationally efficient way to improve imaging system performance.
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