Synchrotron-based micro computed tomography investigation of the implant-abutment fatigue-induced microgap changes

This study evaluates the effect of dynamic-loading on the microgap of the IAC when different supratructure heights are applied.

Forty-eight dental implants (24 each of butt-joint (H) and internal-conical connections (C)) were tested in this study. Each group was further divided into three groups (n = 8) according to the applied suprastructure height (H1, C1: 10 mm, H2, C2: 14 mm and H3, C3: 18 mm). All specimens were subjected to cyclic loading in a chewing-simulator with a load of 98 N for 5 × 10⁶ chewing cycles. The microgap at the IAC was inspected before and after loading, using synchrotron-based micro computed tomography (SRμCT) and light microscopy (LM).

SRμCT revealed an internal microgap range between 0.26 μm and 0.5 μm in the group C, whereas the group H exhibited a microgap range between 0.26 μm and 0.47 μm prior to loading. After chewing simulation, a smaller microgap size in all groups was detected ranging from 0.11 μm to 0.26 μm (group C: 0.11μm-0.26 μm; group H: 0.21μm-0.25 μm). The LM investigation showed mean microgap values at the outer IAC junction before loading from 5.8 μm to 11.3 μm and from 3.9 μm to 7.2 μm after loading. All specimens exhibited a vertical intrusion displacement of the abutment.

Regardless of the crown height, the microgap between the abutment and implant systematically decreased after loading in both butt-joint and internal-conical connections.