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Published on: June 27, 2022
Precise measurement of the electron beam current in a TEM
Florian F Krause1, Marco Schowalter1, Oliver Oppermann1
1Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany.
A new Faraday cup precisely measures electron beam current for transmission electron microscopy (TEM) and quantitative techniques. This device improves accuracy compared to standard methods, especially for low currents (<5pA) using electron counting.
Area of Science:
- Materials Science
- Physics
- Electron Microscopy
Background:
- Quantitative transmission electron microscopy (TEM) methods, like the ζ-factor technique, demand accurate electron beam current measurements.
- Existing methods for measuring electron beam current in TEM often suffer from inaccuracies, particularly at low current levels.
Purpose of the Study:
- To design and validate a macroscopic Faraday cup for precise electron beam current measurement in TEM.
- To assess and compare the accuracy of various electron beam current measurement techniques.
Main Methods:
- Development and implementation of a macroscopic Faraday cup that replaces the TEM viewing screen.
- Comparison of Faraday cup measurements with built-in TEM screen amperimeters, spectrometer drift tubes, ultrafast electron detection cameras, and electron counting techniques.
- Investigation and reformulation of the electron counting technique for improved accuracy at low currents (<5pA).
Main Results:
- The developed Faraday cup provides highly accurate electron beam current measurements, limited only by the amperemeter precision, suitable for currents >5pA.
- Built-in TEM screen amperimeters and general screen measurements tend to underestimate the electron beam current.
- Refined electron counting techniques demonstrate accurate high-precision measurements for currents <5pA.
Conclusions:
- The macroscopic Faraday cup is an affordable, easy-to-install, and highly accurate device for measuring electron beam currents in TEM.
- The study highlights significant inaccuracies in common TEM current measurement methods, necessitating improved techniques.
- Optimized electron counting offers a viable solution for precise low-current measurements in scanning transmission electron microscopy (STEM).
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