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Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

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Photoabsorption Imaging at Nanometer Scales Using Secondary Electron Analysis.

Ze Zhang¹, Joel Martis¹, Xintong Xu¹

¹Department of Mechanical Engineering, Stanford University, Stanford, California 94305, United States.

|February 26, 2021

Summary

We developed photoabsorption microscopy using electron analysis for high-resolution optical imaging. This technique achieves sub-20 nm resolution, overcoming limitations of traditional methods for non-fluorescent materials.

Keywords:

Monte Carlo simulation nanometer resolution photoabsorption imaging scanning electron microscopy

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Area of Science:

Physics
Materials Science
Nanotechnology

Background:

Traditional optical imaging is limited by diffraction to >100 nm resolution.
Existing high-resolution techniques like super-resolution and cathodoluminescence require sample fluorescence, limiting their applicability.
Many materials lack inherent fluorescence, hindering detailed optical analysis.

Purpose of the Study:

To introduce a novel technique for nanometer-scale optical imaging and material characterization.
To overcome the limitations of fluorescence-dependent high-resolution optical methods.
To enable spectrally specific photoabsorption imaging of diverse materials.

Main Methods:

Photoabsorption microscopy using electron analysis (PAMEA).
Probing spectrally specific photoabsorption using a scanning electron microscope.
Utilizing photoabsorption-induced surface photovoltage to modulate secondary electron emission.

Main Results:

Demonstrated spectrally specific photoabsorption imaging with sub-20 nm spatial resolution.
Successfully imaged silicon, germanium, and gold nanoparticles.
Validated the technique's efficacy for non-fluorescent nanomaterials.

Conclusions:

PAMEA offers a general approach for nanometer-scale optical spectroscopic imaging.
The technique overcomes the fluorescence requirement of other high-resolution methods.
Potential for further resolution improvement to a few nanometers exists.