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Updated: Nov 15, 2025

Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing
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Cryogenic GaAs high-electron-mobility-transistor amplifier for current noise measurements

Sanghyun Lee1, Masayuki Hashisaka1, Takafumi Akiho1

  • 1NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan.

The Review of Scientific Instruments
|March 2, 2021
PubMed

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