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Wenxin Hu1, Hong Miao2, Keyu Yan1
1Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection, College of Physics and Optoelectronic Engineering, Shenzhen University, 3688 Nanhai Avenue, Shenzhen 518060, China.
View abstract on PubMed
This study introduces a novel neural network method for fringe phase extraction in optical metrology. The U-net based approach simplifies processing and achieves accurate, robust results faster than traditional techniques.
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