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Bipolar Resistive Switching in Junctions of Gallium Oxide and p-type Silicon
Mahmoud N Almadhoun1, Maximilian Speckbacher2, Brian C Olsen1
1Department of Chemistry, University of Alberta, 11227 Saskatchewan Drive, Edmonton, Alberta T6G 2G2, Canada.
Abstract:
In this work, native GaO is positioned between bulk gallium and degenerately doped p-type silicon (p+-Si) to form Ga/GaO/SiO/p+-Si junctions. These junctions show memristive behavior, exhibiting large current-voltage hysteresis. When cycled between -2.5 and 2.5 V, an abrupt insulator-metal transition is observed that is reversible when the polarity is reversed. The ON/OFF ratio between the high and low resistive states in these junctions can reach values on the order of 108 and retain the ON and OFF resistive states for up to 105 s with an endurance exceeding 100 cycles. The presence of a nanoscale layer of gallium oxide is critical to achieving reversible resistive switching by formation and dissolution of the gallium filament across the switching layer.
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