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Updated: Nov 12, 2025

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
High-accuracy measurement system for the refractive index of air based on a simple double-beam interferometry
Abstract:
A measurement system based on a simple double-beam interferometry is built to realize the measurement of air refractive index with high accuracy. The basic principle of the system is that, through measuring the change of optical path difference caused by rapid and smooth vacuumization, measurement of refractive index of air is converted to length measurement. Error correction and signal processing are studied to ensure high-accuracy measurement of the refractive index of air. Three applicable methods are used in system. The system based on the methods realize the subdivision and counting of interference fringe by software with three-error correction, error compensation for the end-window plates' thickness change caused by vacuumization, steady realization of high vacuum conditions. To verify the accuracy and reliability of the system, the measurement results are compared with that obtained from the method based on empirical Edlén's formula. Analysis result shows that the expanded measurement uncertainty of the system is U = 5×10-9, with k = 2. The system can be used to compensate the laser wavelength error caused by the refractive index of air with high accuracy.
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