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Phase Function Effects on Identification of Terahertz Spectral Signatures Using the Discrete Wavelet Transform
Mahmoud E Khani1, Dale P Winebrenner2, M Hassan Arbab1
1Department of Biomedical Engineering, Stony Brook University, Stony Brook, NY, 11794 USA.
Discrete Wavelet Transform (DWT) effectively extracts material absorption signatures from terahertz spectra. This signal processing technique, with phase correction, enables robust material identification in non-destructive evaluation.
Area of Science:
- Spectroscopy and Spectrometry
- Signal Processing
- Materials Science
Background:
- Terahertz (THz) spectroscopy is valuable for material identification.
- Extracting characteristic absorption signatures from THz spectra can be challenging due to scattering.
- Wavelet transforms offer potential for signal analysis in complex spectral data.
Purpose of the Study:
- To apply the Discrete Wavelet Transform (DWT) for extracting material absorption signatures from THz reflection spectra.
- To evaluate the performance of different mother wavelets (Daubechies, LA, Coiflet) in this application.
- To develop a phase correction method for accurate spectral analysis using DWT.
Main Methods:
- Application of Discrete Wavelet Transform (DWT) to terahertz reflection spectra.
- Comparison of Daubechies, Least Asymmetric (LA), and Coiflet mother wavelets.
- Calculation of advancement coefficients for zero-phase DWT.
- Testing with alpha-lactose monohydrate/polyethylene samples with varying surface roughness.
Main Results:
- Wavelet and scaling filter phase functions cause spectral shifts in the wavelet domain.
- A method for achieving zero-phase DWT using advancement coefficients was developed.
- The DWT-based algorithm successfully extracted 0.53 and 1.38 THz resonant signatures.
- Extraction was effective even with significant surface scattering effects.
Conclusions:
- DWT is a powerful tool for analyzing terahertz spectra.
- Phase correction is crucial for accurate spectral signature extraction using DWT.
- The DWT analysis provides a robust method for material identification in terahertz non-destructive evaluation (NDE).
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