Related Experiment Video

Updated: Nov 11, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

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Interface-engineered electron and hole tunneling

Rui Guo1,2, Lingling Tao3, Ming Li3

  • 1Department of Materials Science and Engineering, National University of Singapore, 117575 Singapore, Singapore.

Science Advances
|March 25, 2021
PubMed

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