Three-Dimensional Analysis of Strain
Electron Microscope Tomography and Single-particle Reconstruction
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Updated: Nov 11, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Renliang Yuan1, Jiong Zhang2, Lingfeng He3
1Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA; Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA.
Artificial neural networks (ANNs) and convolutional neural networks (CNNs) can now precisely map crystal orientation and strain. This new method uses simulated electron diffraction patterns for advanced materials analysis.
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