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Sai Saraswathi Yarajena1, Rabindra Biswas2, Varun Raghunathan2
1Centre for Nano Science and Engineering, Indian Institute of Science, Bengaluru, 560012, India. saiyarajena@iisc.ac.in.
Researchers developed a new method to measure in-plane piezoelectricity in 2D materials using lateral Piezoresponse Force Microscopy (PFM). This technique quantifies piezoelectric coupling coefficients in materials like MoS2, revealing how it changes with layer thickness.
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