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Vision chromatic confocal sensor based on a geometrical phase lens.

Hyo Mi Park, Uihyeok Kwon, Ki-Nam Joo

    Applied Optics
    |April 2, 2021
    PubMed
    Summary

    A novel chromatic confocal sensor utilizes a geometric phase lens for precise distance sensing and point monitoring. This optical sensor achieves high repeatability for accurate measurements in various applications.

    Area of Science:

    • Optics and Photonics
    • Metrology
    • Sensor Technology

    Background:

    • Chromatic confocal microscopy offers non-contact measurement capabilities.
    • Traditional chromatic confocal systems often require complex optical setups.
    • Integrating beam splitting and chromatic aberration induction simplifies sensor design.

    Purpose of the Study:

    • To propose and experimentally validate a vision chromatic confocal sensor.
    • To demonstrate the sensor's capability for distance sensing and point monitoring.
    • To utilize a geometric phase lens for both chromatic aberration and beam splitting.

    Main Methods:

    • A geometric phase lens was employed to induce chromatic aberration and act as a beam splitter.
    • A focused beam configuration was used for the confocal sensor.

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  • A diverging beam was utilized for specimen imaging.
  • Experimental verification involved distance sensing and point monitoring tests.
  • Main Results:

    • The proposed vision chromatic confocal sensor was experimentally verified.
    • The system demonstrated effective distance sensing and point monitoring capabilities.
    • A measuring range of approximately 10 mm was achieved.
    • A repeatability of 0.4 µm was obtained using a 75 mm focal length geometric phase lens.

    Conclusions:

    • The developed vision chromatic confocal sensor is effective for precise distance and position measurements.
    • The integration of a geometric phase lens simplifies the optical design while maintaining performance.
    • The sensor shows potential for applications requiring high-accuracy, non-contact metrology.