Time-dependent soft and hard x-ray measurements using streak and x-ray diode array diagnostic systems.

Area of Science:

• Plasma Physics
• X-ray Diagnostics
• High-Energy-Density Science

Background:

• High-temperature, high-density experiments necessitate simultaneous temporal and spectral characterization.
• Existing diagnostics may lack the required temporal resolution or spectral discrimination.

Purpose of the Study:

• Introduce and validate the spectral x-ray streak camera (SXSC) for high-temporal-resolution spectral x-ray diagnostics.
• Enable differentiation between soft and hard x-ray regions in dynamic experiments.

Main Methods:

• Developed a spectral x-ray streak camera (SXSC) with three spectral channels (one direct, two indirect with mirrors and filters).
• Utilized an opto-mechanical design to position filtered radiation for time-dependent spectral analysis with picosecond resolution.
• Employed slits perpendicular to the photo-cathode slit for moderate spatial resolution (150-700 μm).
• Calibrated temporal and spatial axes using a sequence of x-ray pulses.

Main Results:

• The SXSC system covers a broad spectral range (30-500 eV for mirror channels, >1300 eV for direct channel).
• Demonstrated picosecond temporal resolution for time-dependent spectral measurements.
• Validated the diagnostic using Marshak-wave emission from laser-heated SiO2 foam, comparing results with an x-ray diode array.

Conclusions:

• The spectral x-ray streak camera (SXSC) is a viable diagnostic for high-temperature, high-density experiments requiring precise temporal and spectral information.
• The SXSC enables detailed analysis of x-ray emission across different spectral regions with high temporal fidelity.
• This diagnostic advances the capability to study dynamic processes in extreme environments.