Broadband femtosecond spectroscopic ellipsometry
Steffen Richter1, Mateusz Rebarz1, Oliver Herrfurth2
1ELI Beamlines/Fyzikální ústav AV ČR, v.v.i., Za Radnicí 835, 25241 Dolní Břežany, Czech Republic.
The Review of Scientific Instruments
|April 6, 2021
Summary
We developed a new time-resolved spectroscopic ellipsometry setup using femtosecond laser pulses. This system achieves 100 fs temporal resolution for studying transient material properties across a broad spectral range.
Area of Science:
- Materials Science
- Spectroscopy
- Optics
Background:
- Time-resolved spectroscopic ellipsometry is crucial for understanding ultrafast material dynamics.
- Existing setups face challenges in temporal resolution and spectral range.
Purpose of the Study:
- To present a novel setup for time-resolved spectroscopic ellipsometry.
- To achieve high temporal resolution and broad spectral coverage for pump-probe experiments.
Main Methods:
- Utilized femtosecond laser pulses in a pump-probe configuration.
- Employed supercontinuum white light as the probe pulse, delayed relative to the pump.
- Implemented a polarizer-sample-compensator-analyzer setup for ellipsometric measurements.
- Scanned compensator azimuthal angle to obtain transient ellipsometric parameters from reflectance-difference spectra.
Main Results:
- Achieved a temporal resolution of approximately 100 fs.
- Covered a spectral range from near-infrared to near-ultraviolet (1.3 eV–3.6 eV).
- Demonstrated measurements over a delay range exceeding 5 ns.
- Analyzed and addressed issues related to probe pulse fluctuations and polarization optics imperfections.
Conclusions:
- The developed setup enables high-resolution, time-resolved spectroscopic ellipsometry.
- The system is suitable for investigating ultrafast phenomena in materials across a wide spectral range.
- Strategies for overcoming technical challenges ensure reliable data acquisition.
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