Multiscale measurements with adjustable x-ray spot size for in situ imaging and diffraction

Area of Science:

• Materials Science
• Physics
• Engineering

Background:

• Synchrotron X-ray imaging typically requires a large field of view.
• X-ray diffraction experiments necessitate a small X-ray spot size.
• Simultaneously achieving both requirements is challenging for in situ studies.

Purpose of the Study:

• To develop a multiscale measurement system with an adjustable X-ray spot size.
• To accommodate varying spot size needs for in situ phase-contrast imaging and diffraction.
• To enable simultaneous or sequential measurements with optimized resolution and field of view.

Main Methods:

• Designed a system with collinear diffraction and imaging scintillators, including a through-hole in the diffraction scintillator.
• Integrated an adjustable X-ray spot size capability.
• Utilized X-ray digital image correlation for strain field analysis.

Main Results:

• Demonstrated proof-of-principle experiments on a magnesium alloy under uniaxial tension.
• Achieved full azimuthal range diffraction measurements with improved resolution.
• Obtained large field-of-view strain field measurements.

Conclusions:

• The multiscale measurement system is feasible for advanced in situ materials characterization.
• The system effectively combines high-resolution diffraction with wide-field imaging.
• It enhances the study of material behavior under mechanical load.