Thickness dependent photocurrent spectra and current-voltage characteristics of P3HT:PCBM photovoltaic devices

P3HT:PCBM based photovoltaic devices with different active layer thicknesses (ALTs) were examined in photodetector and solar cell operation modes. The photodetector photocurrent spectra and solar cell current density-voltage characteristics were measured. All experimental results were reproduced by the unique drift-diffusion model which excludes the optical interference and allows the parameters of photogeneration, transport, and recombination to be ALT dependent. The active layer optical characterization indicated a thickness dependence of optical parameters too. A conclusion was drawn that the P3HT:PCBM film thickness and morphology are strongly correlated which leads to a non-monotonic change of film parameters with its thickness.