Determination of starch crystallinity with the Fourier-transform terahertz spectrometer

We measured the terahertz (THz) spectra of native, amorphous, and dried starches derived from corn and potato using the Fourier-transform (FT) system and compared these spectra to the X-ray diffraction (XRD) patterns. Both native corn and potato starches had seven absorption peaks in the terahertz regions, but five peaks were observed in the amorphous states. While spectral changes slightly occurred in corn starch even after drying, increase and decrease in the terahertz peak intensities were obtained in potato starch during drying. Similar changes in both starches during amorphization and drying were obtained in the X-ray diffraction patterns, and the correlations were found between terahertz peaks and the X-ray signals. Since the intensity of the peak at 9.0 THz was correlated with crystallinity obtained using an X-ray diffraction (r² = 0.98), our data indicate that the Fourier-transform terahertz spectrometer can be a new analytical device to measure the starch crystallinity.