Simulation and analysis of variable numerical aperture wide-field microscopy for telecentricity with constant

Neelam Barak1, Vineeta Kumari2, Gyanendra Sheoran2

  • 1Department of ECE, NIT Delhi, NILERD Campus, Narela, Delhi, 110040, India.

Micron (Oxford, England : 1993)
|April 12, 2021
PubMed
Summary

This study introduces a novel microscope system combining a variable numerical aperture objective and an Electrically Tunable Lens (ETL) for improved axial scanning. The new design offers consistent magnification, field-of-view, and resolution, overcoming limitations of conventional systems.