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Transverse Beam Emittance Measurement by Undulator Radiation Power Noise
Ihar Lobach1, Sergei Nagaitsev2, Valeri Lebedev2
1The University of Chicago, Department of Physics, Chicago, Illinois 60637, USA.
Physical Review Letters
|April 16, 2021
Summary
Researchers precisely measured a flat beam's small vertical emittance using synchrotron radiation power fluctuations. This method determined beam characteristics unresolvable by standard monitors.
Area of Science:
- Accelerator Physics
- Particle Beam Diagnostics
Background:
- Turn-to-turn power fluctuations of synchrotron radiation are linked to electron bunch 6D phase-space distribution.
- This relationship can allow determination of unknown distribution parameters from measured power fluctuations.
Purpose of the Study:
- To report an absolute measurement of a flat beam's small vertical emittance.
- To demonstrate a method for measuring beam parameters unresolvable by conventional monitors.
Main Methods:
- Utilizing turn-to-turn power fluctuations of incoherent spontaneous synchrotron radiation.
- Employing an absolute measurement technique without free parameters or calibration.
Main Results:
- Successfully measured a small vertical emittance (5-15 nm rms) for a flat beam.
- Achieved measurement under conditions where the vertical emittance was unresolvable by a conventional synchrotron light beam size monitor.
Conclusions:
- The power fluctuation method provides an effective, absolute measurement of small vertical emittance.
- This technique offers a valuable diagnostic tool for flat beams in storage rings.
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