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Updated: Nov 9, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Zhong-Mei Huang1, Shi-Rong Liu2, Hong-Yan Peng3
1Institute of Nanophotonic Physics, Guizhou University, Guiyang, 550025, China.
The laser reflecting Talbot magnification (LRTM) effect reveals high-order nonlinear imaging and plasmonic structures on photonic crystals. Optimized beam wavefronts enhance magnification and resolution for applications like pulsed laser etching monitoring.
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