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An RFID-Based Self-Biased 40 nm Low Power LDO Regulator for IoT Applications.
Asghar Bahramali1, Marisa Lopez-Vallejo1
1IPTC, ETSI Telecomunicación, Universidad Politécnica de Madrid, Avda. Complutense 30, 28040 Madrid, Spain.
This study introduces a novel 1.1 V low dropout (LDO) linear regulator for Internet of Things (IoT) nodes, designed for ultra-low power consumption and minimal die area. The innovative design addresses power and space constraints in emerging IoT applications.
Area of Science:
- Electrical Engineering
- Integrated Circuit Design
- Internet of Things (IoT)
Background:
- Emerging IoT applications require low-power, compact regulators for nodes with limited accessibility and harsh environments.
- Power and area constraints are critical concerns for embedded IoT systems.
Purpose of the Study:
- To design a 1.1 V low dropout (LDO) linear regulator specifically for embedded IoT nodes.
- To address power and area constraints using advanced ultra-low power techniques.
Main Methods:
- Utilized state-of-the-art, variability-aware, resistor-less, sub-threshold biased CMOS-only configurations.
- Integrated internal compensation with embedded Miller and load capacitances (18 pF and 10 pF).
- Designed for 40 nm technology with a focus on low active area and ultra-low power consumption.
Main Results:
- Achieved a 1.1 V LDO with 200 mV dropout voltage and 1.3 V minimum input voltage.
- Supplies 1 mA maximum load current with only 0.8 uA quiescent current.
- Attained 84% efficiency, nearing the maximum achievable for the given dropout voltage, with 1 μW total power consumption and a die size under 0.007 mm2.
Conclusions:
- The designed LDO regulator effectively meets the stringent power and area requirements for embedded IoT applications.
- The ultra-low power, compact design enables reliable operation in challenging environments and for nodes with limited accessibility.
- This work presents a significant advancement for power-efficient IoT node design.
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