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Thermal Imaging of Block Copolymers with Sub-10 nm Resolution.

Steven Gottlieb1, Louis Pigard2, Yu Kyoung Ryu3

  • 1Instituto de Microelectrónica de Barcelona (IMB-CNM, CSIC), Carrer dels Tillers s/n, 08193 Bellaterra, Barcelona, Spain.

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|May 3, 2021
PubMed
Summary

This study introduces a high-resolution thermal imaging technique using silicon probes, achieving sub-10 nm resolution. It reveals insights into heat transport in block copolymers at the nanoscale.

Keywords:
block copolymerscoarse-grained transport modelhigh resolutionmolecular simulationscanning thermal microscopythermal transportthin films

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Thermal Analysis

Background:

  • Thermal silicon probes offer high-resolution thermal property investigation.
  • A precise assessment of achievable resolution in thermal imaging is lacking.
  • Understanding nanoscale heat transport is crucial for advanced materials.

Purpose of the Study:

  • To present a probe-based thermal imaging technique with sub-10 nm lateral resolution.
  • To demonstrate the technique's capability by resolving nanoscale structures.
  • To quantitatively assess heat flux in block copolymers and compare with simulations.

Main Methods:

  • Development of a probe-based thermal imaging technique.
  • Imaging of microphase-separated polystyrene-block-poly(methyl methacrylate) (PS-b-PMMA) copolymers.
  • Quantitative comparison with coarse-grained molecular dynamics simulations of energy transport.

Main Results:

  • Achieved sub-10 nm lateral resolution at a sub-10 ms pixel rate.
  • Resolved lamellar structures of PS-b-PMMA block copolymers (11-19 nm half-period).
  • Observed heat flux asymmetry and quantified inter-polymer heat transfer, revealing intramolecular transport enhancement and Kapitza resistance.

Conclusions:

  • The developed technique provides unprecedented nanoscale thermal imaging resolution.
  • Heat transport in PS-b-PMMA is influenced by intramolecular pathways and interfacial Kapitza resistance.
  • The study determined a tip-sample contact radius of approximately 4 nm.