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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Residual-based pattern center calibration in high-resolution electron backscatter diffraction.

Hongru Zhong1, Qiwei Shi1, Zhe Chen1

  • 1State Key Laboratory of Metallic-matrix Composites, Shanghai Jiao Tong University, Shanghai 200240, PR China.

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|May 6, 2021
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Summary
This summary is machine-generated.

Accurate calibration of the pattern center (PC) in high-resolution electron backscatter diffraction (HR-EBSD) is crucial for precise elastic strain measurement. Using an integrated digital image correlation algorithm to minimize image residuals effectively refines PC calibration, reducing errors in strain analysis.

Keywords:
Digital image correlationEBSD calibrationElastic strainHigh-resolution EBSDPattern centerPhantom strain

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Area of Science:

  • Materials Science
  • Crystallography
  • Mechanical Engineering

Background:

  • High-resolution electron backscatter diffraction (HR-EBSD) is an advanced micro-structural characterization technique.
  • Accurate local elastic strain measurement using HR-EBSD relies on precise calibration of parameters like the pattern center (PC) coordinate.
  • Existing commercial software may provide initial PC values that introduce errors, impacting strain analysis accuracy.

Purpose of the Study:

  • To propose and validate a novel method for calibrating the pattern center (PC) coordinate in HR-EBSD.
  • To utilize the residual value from an integrated digital image correlation (IDIC) algorithm as a criterion for PC calibration.
  • To demonstrate the improvement in elastic strain measurement accuracy by refining PC calibration.

Main Methods:

  • Implementation of an integrated digital image correlation (IDIC) algorithm to extract deformation gradient tensors.
  • Utilizing the residual error between reference and targeted images as a metric for PC calibration.
  • Calibration of PC coordinates by minimizing the residual value, alongside sample tilt parameters, using simulated and experimental diffraction patterns.

Main Results:

  • The proposed method successfully calibrates the PC coordinate by minimizing image residuals.
  • Accurate PC calibration, combined with sample tilt parameters, leads to a slight reduction in residuals with simulated diffraction patterns.
  • Experimental data confirms that calibrated PC values significantly reduce the retrieved Von Mises strain by mitigating phantom strain errors.

Conclusions:

  • The residual value from IDIC serves as an effective criterion for calibrating the PC coordinate in HR-EBSD.
  • Refined PC calibration minimizes errors stemming from initial PC estimations by commercial software.
  • This improved calibration enhances the accuracy of local elastic strain measurements obtained via HR-EBSD.