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Updated: Nov 6, 2025

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
Published on: July 12, 2016
R G Forbes1, E O Popov2, A G Kolosko2
1Advanced Technology Institute and Department of Electrical and Electronic Engineering, University of Surrey, Guildford, Surrey GU2 7XH, UK.
Comparing theoretical and experimental k-values in field electron emission (FE) provides a sensitive tool for validating FE theories. This method aids in selecting between competing theories by analyzing current-voltage data.
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