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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Matthew Tivnan1, Wenying Wang1, J Webster Stayman1
1Johns Hopkins University, 720 Rutland Ave., Traylor Building 605, Baltimore, MD, 21205, USA.
This study introduces spatial-spectral filters for multi-contrast imaging using spectral CT. These filters enable enhanced material decomposition with existing energy-integrating detectors, improving spectral CT capabilities.
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