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Updated: Nov 6, 2025

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
Published on: October 25, 2021
Sebastian Tacke1, Philipp Erdmann2, Zhexin Wang1
1Department of Structural Biochemistry, Max Planck Institute of Molecular Physiology, Otto-Hahn-Str. 11, 44227 Dortmund, Germany.
New hardware and software improve cryo-electron tomography (cryo-ET) sample preparation. This enhanced cryo-focused ion beam (cryo-FIB) milling reduces contamination and increases throughput for high-resolution cellular imaging.
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