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Single-pixel imaging of high-temperature objects.

Shuangyan Xu, Jin Zhang, Guan Wang

|May 13, 2021

Summary

This summary is machine-generated.

This study introduces a novel single-pixel imaging method to improve visual measurements of high-temperature components. The technique effectively reduces interference from object radiation and hot gas flow, enhancing image quality for industrial applications.

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Area of Science:

Optical Engineering
Imaging Science
Materials Science

Background:

High-temperature visual measurements face challenges from component radiation and hot gas flow.
Existing imaging methods struggle with image quality degradation in harsh industrial environments.

Purpose of the Study:

To propose and validate a new image acquisition method for high-temperature components.
To mitigate interference from self-radiation and thermal distortions in imaging.

Main Methods:

Utilized single-pixel imaging (SPI) by projecting illumination patterns onto the object.
Reconstructed object images from light waves detected by a single-pixel detector.
Investigated SPI performance across various temperatures and spectral segments.

Main Results:

Demonstrated significant reduction in interference from high-temperature object radiation.
Successfully minimized image halo effects caused by high temperatures.
Validated the method's effectiveness for different temperatures and spectral ranges.

Conclusions:

The proposed single-pixel imaging method effectively reduces radiation interference and thermal distortions.
This advancement offers a promising solution for imaging high-temperature industrial components.
The study provides impetus for SPI's application in demanding industrial settings.