X-ray Crystallography
X-ray Diffraction of Biological Samples
Scanning Electron Microscopy
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Updated: Nov 4, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Michael Chapman1,2, Marc De Graef1, Richard D James3
1Materials Science and Engineering, Carnegie Mellon University, PA 15213, USA.
We developed a method using electron backscatter diffraction to identify martensite variants in materials. This helps understand shape memory alloys with high reversibility and low hysteresis.
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