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Jinseok Ryu1, Hyeohn Kim1, Ryeong Myeong Kim1
1Department of Materials Science & Engineering and Research Institute of Advanced Materials (RIAM), Seoul National University, 08826, Seoul, South Korea.
This study introduces a machine learning approach for analyzing electron energy loss spectroscopy spectrum images (EELS-SI). The method effectively differentiates spectral data, enabling detailed material analysis without prior knowledge.
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