Enhancing Dielectric Strength of Epoxy Polymers by Constructing Interface Charge Traps

Area of Science:

• Materials Science
• Polymer Chemistry
• Electrical Engineering

Background:

• Epoxy polymers are vital dielectric materials in electronics and power equipment.
• High voltage applications demand superior dielectric strength in epoxy polymers.
• Existing epoxy-nanoparticle dielectrics show promise but have limitations in preventing molecular structure damage from high-energy electrons.

Purpose of the Study:

• To develop a novel strategy for enhancing the dielectric strength of epoxy polymers.
• To improve the resilience of epoxy polymers against high-energy electron-induced breakdown.
• To investigate the impact of molecular structural modifications on dielectric properties.

Main Methods:

• A general strategy was developed to introduce interface charge traps into the epoxy polymer matrix.
• The -CF3 group was used to partially replace the -CH3 group in the epoxy polymer's molecular structure.
• Dielectric strength and surface breakdown voltage were measured to evaluate the material's performance.

Main Results:

• The modified epoxy polymer exhibited a dielectric strength of 39.5 kV mm-1, a 22.08% increase.
• The surface breakdown voltage reached 26.9 kV, a 13.3% improvement.
• The strategy effectively hindered high-energy electron movement and did not degrade mechanical or thermal properties.

Conclusions:

• Constructing interface charge traps in the epoxy polymer molecular structure is an effective method to enhance dielectric strength.
• The developed epoxy polymer demonstrates improved performance for high-voltage stress applications.
• This approach offers potential for manufacturing advanced electrical and electronic equipment.