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Updated: Nov 3, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Cristina Medina-Bailon1,2, José Luis Padilla1, Carlos Sampedro1
1Nanoelectronics Research Group, Departamento de Electrónica y Tecnología de Computadores, Universidad de Granada, 18071 Granada, Spain.
This study improves ultrascaled device simulations by addressing overestimated currents in the subthreshold regime. Modifying current calculations using the Landauer formalism is recommended for better accuracy in multi-scale electrostatic modeling (MS-EMC).
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