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Summary
This summary is machine-generated.

This study improves ultrascaled device simulations by addressing overestimated currents in the subthreshold regime. Modifying current calculations using the Landauer formalism is recommended for better accuracy in multi-scale electrostatic modeling (MS-EMC).

Keywords:
DGSOIFinFETLandauer formalismdirect source-to-drain tunnelingmulti-subband ensemble Monte Carlonon-equilibrium Green’s functionstunneling probability

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Area of Science:

  • Semiconductor device physics
  • Quantum transport phenomena
  • Computational electronics

Background:

  • Simulations of ultrascaled devices using multi-scale electrostatic modeling (MS-EMC) often overestimate current levels in the subthreshold regime.
  • This inaccuracy hinders the precise analysis and design of modern electronic components.

Purpose of the Study:

  • To address and correct the overestimation of current levels in the subthreshold regime for ultrascaled devices simulated with MS-EMC.
  • To enhance the predictive capabilities of MS-EMC by proposing and evaluating self-consistent solutions.

Main Methods:

  • Two distinct self-consistent solutions were investigated: 1) Reformulating tunneling probability computation by modulating the Wentzel-Kramers-Brillouin (WKB) approximation. 2) Implementing a change in the current calculation technique utilizing the Landauer formalism.
  • The results obtained from both proposed methods were rigorously compared and contrasted with non-equilibrium Green's function (NEGF) results generated by the NESS simulator.

Main Results:

  • Both proposed methods demonstrated improvements in addressing the subthreshold current overestimation.
  • The modification of the current calculation technique based on the Landauer formalism showed superior performance and accuracy compared to the WKB approximation modulation.

Conclusions:

  • The current computation modification using the Landauer formalism is identified as the most suitable and advisable strategy for enhancing the MS-EMC tool.
  • This improvement is crucial for accurate simulation of ultrascaled devices, particularly in the critical subthreshold regime.