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Updated: Nov 2, 2025

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators
Published on: August 15, 2014
Hyunjong Lee1, Odongo Francis Ngome Okello2, Gi-Yeop Kim2
1Korea Institute of Industrial Technology, Incheon, 21999, South Korea.
We developed a new optical microscopy system for easier and safer transmission electron microscopy (TEM) sample preparation. This method efficiently transfers various nano-scale samples onto micro-electro mechanical systems (MEMS) chips.
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