Mueller matrix ellipsometer based on discrete-angle rotating Fresnel rhomb compensators

Area of Science:

• Optical physics
• Spectroscopic ellipsometry
• Polarimetry

Background:

• Mueller matrix ellipsometry is a powerful technique for characterizing optical properties.
• Traditional rotating compensator ellipsometers face limitations with low-light samples and detector exposure time.

Purpose of the Study:

• To develop and describe a novel spectroscopic Mueller matrix ellipsometer.
• To enhance measurement stability and accuracy, particularly for low-intensity samples.
• To enable flexible detector exposure time control.

Main Methods:

• Utilized two rotating Fresnel rhomb compensators with achromatic response and optimal retardance.
• Implemented discrete compensator rotation instead of continuous rotation.
• Employed an optimization algorithm to determine optimal discrete angles for noise-robust Mueller matrix determination.

Main Results:

• Demonstrated a well-conditioned measurement capability for low-intensity samples.
• Achieved independent control over CCD detector exposure time.
• Provided examples of experimentally determined Mueller matrices, validating the instrument's performance.

Conclusions:

• The developed spectroscopic Mueller matrix ellipsometer offers significant advantages in stability and flexibility.
• Discrete compensator rotation and optimization algorithms enhance measurement accuracy in noisy conditions.
• The instrument is suitable for a wide range of optical characterization applications.