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Evaluating Plasmonic Transport in Current-carrying Silver Nanowires
Published on: December 11, 2013
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Electronic Temperature and Two-Electron Processes in Overbias Plasmonic Emission from Tunnel Junctions
Alberto Martín-Jiménez1, Koen Lauwaet1, Óscar Jover1,2
1IMDEA Nanoscience, 28049 Madrid, Spain.
Nano Letters
|June 21, 2021
Summary
Accurately measure electronic temperatures in metallic nanostructures using tunnel electroluminescence. A new method reveals deviations between electronic and lattice temperatures below 30 K due to a two-electron process.
Area of Science:
- Condensed matter physics
- Materials science
- Nanotechnology
Background:
- Accurate electronic temperature determination is crucial for plasmon-enhanced catalysis and nanofabrication.
- Understanding electron-phonon coupling in nanostructures is key to controlling their properties.
Purpose of the Study:
- To demonstrate a novel method for measuring electronic temperatures in metallic nanostructures.
- To investigate the deviation between electronic and lattice temperatures at low temperatures.
Main Methods:
- Utilizing tunnel electroluminescence emission edge shape in tunnel plasmonic nanocavities.
- Analyzing the universal thermal distribution with bias voltage as chemical potential.
Main Results:
- Electronic temperature accurately measured by electroluminescence emission edge shape.
- Significant deviation between electronic and lattice temperatures observed below 30 K for currents > 15 nA.
- Deviation explained by a two-electron process exciting plasmon modes.
Conclusions:
- Tunnel electroluminescence provides a new method for determining electronic temperatures.
- The findings resolve long-standing controversies regarding overbias emission in tunnel junctions.
- This work offers insights into quasiparticle dynamics in nanostructures.
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