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Updated: Nov 1, 2025

Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps
Published on: August 17, 2017
Heating of a Trapped Ion Induced by Dielectric Materials
Markus Teller1, Dario A Fioretto1, Philip C Holz1,2
1Institut für Experimentalphysik, Universität Innsbruck, Technikerstrasse 25, 6020 Innsbruck, Austria.
Abstract:
Electric-field noise due to surfaces disturbs the motion of nearby trapped ions, compromising the fidelity of gate operations that are the basis for quantum computing algorithms. We present a method that predicts the effect of dielectric materials on the ion's motion. Such dielectrics are integral components of ion traps. Quantitative agreement is found between a model with no free parameters and measurements of a trapped ion in proximity to dielectric mirrors. We expect that this approach can be used to optimize the design of ion-trap-based quantum computers and network nodes.
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