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Updated: Oct 31, 2025

High Pressure Single Crystal Diffraction at PX^2
Published on: January 16, 2017
Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus silicon
Vladimir M Kaganer1, Ilia Petrov2, Liubov Samoylova2
1Paul-Drude-Institut für Festkörperelektronik, Leibniz-Institut im Forschungsverbund Berlin e. V., Hausvogteiplatz 5-7, 10117 Berlin, Germany.
Abstract:
The resolution function of a spectrometer based on a strongly bent single crystal (bending radius of 10 cm or less) is evaluated. It is shown that the resolution is controlled by two parameters: (i) the ratio of the lattice spacing of the chosen reflection to the crystal thickness and (ii) a single parameter comprising crystal thickness, its bending radius, distance to a detector, and anisotropic elastic constants of the chosen crystal. The results allow the optimization of the parameters of bent-crystal spectrometers for the hard X-ray free-electron laser sources.
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