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A Deep Learning Approach for Molecular Classification Based on AFM Images
Jaime Carracedo-Cosme1,2, Carlos Romero-Muñiz3,4, Rubén Pérez2,5
1Quasar Science Resources S.L., Camino de las Ceudas 2, E-28232 Las Rozas de Madrid, Spain.
Nanomaterials (Basel, Switzerland)
|July 2, 2021
Summary
This study introduces a deep learning model for classifying atomic force microscopy (AFM) images. By incorporating experimental data features into theoretical datasets, the model achieves high accuracy in identifying molecular systems from AFM images.
Area of Science:
- Surface Science
- Computational Chemistry
- Machine Learning
Background:
- Non-contact atomic force microscopy (AFM) offers high resolution for molecular imaging.
- Unambiguous identification of molecules from AFM images alone is challenging.
- Current interpretation methods require prior knowledge or extensive analysis.
Purpose of the Study:
- To develop an automated method for classifying AFM experimental images.
- To address the limitations of standard pattern recognition models in AFM image analysis.
- To improve the accuracy and generalizability of AFM image classification.
Main Methods:
- A deep learning model, specifically a variational autoencoder (VAE), was developed and trained.
- The model was primarily trained on a theoretically generated dataset.
- Few experimental AFM images were used to incorporate characteristic features into the training set.
Main Results:
- The developed deep learning model demonstrated optimal depth for accurate AFM image classification.
- The model showed a high ability to generalize across both theoretical and experimental datasets.
- A variational autoencoder (VAE) effectively integrated experimental features for enhanced classification.
Conclusions:
- The study presents a significant step towards automated AFM image classification.
- The VAE-based approach enhances the accuracy of identifying molecular systems from AFM data.
- This method facilitates more reliable and efficient analysis of AFM experimental images.

