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Updated: Oct 30, 2025

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
Published on: August 26, 2015
Direct cross-sectional imaging using X-ray Compton scattering: application to commercial batteries
Naruki Tsuji1, Kentaro Kajiwara1, Masayoshi Itou1
1JASRI/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan.
Compton scattering imaging enables rapid, 3D visualization of internal structures without sample rotation. This advanced technique quickly captures cross-sectional data, ideal for detailed component analysis.
Area of Science:
- Physics
- Materials Science
- Imaging Technology
Background:
- Traditional imaging techniques often require sample rotation or longer acquisition times.
- Visualizing internal structures of small components like batteries can be challenging.
Purpose of the Study:
- To demonstrate the feasibility of Compton scattering imaging for rapid 3D reconstruction.
- To showcase the technique's ability to image without sample rotation.
Main Methods:
- Utilized a synchrotron-based X-ray source for Compton scattering imaging.
- Acquired 74 cross-sectional images of a CR2023 coin battery consecutively.
- Scanned the incident X-ray beam along one direction for data acquisition.
Main Results:
- Successfully obtained a cross-sectional image in 34 milliseconds.
- Reconstructed a 3D image of the coin battery's entire structure.
- Demonstrated high-speed imaging and 3D reconstruction without sample manipulation.
Conclusions:
- Compton scattering imaging is a viable method for rapid, non-rotational 3D imaging.
- The technique allows for efficient visualization of internal structures in components.
- This advancement has potential applications in quality control and material analysis.
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