Related Experiment Video
Updated: Oct 30, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Structural investigations into a new polymorph of F4TCNQ: towards enhanced semiconductor properties
Natalie T Johnson1, Michael R Probert1, Paul G Waddell1
1Chemistry, School of Natural and Environmental Sciences, Newcastle University, Bedson Building, Edward's Walk, Newcastle Upon Tyne NE1 7RU, UK.
Abstract:
During the course of research into the structure of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4TCNQ), C12F4N4, an important compound in charge-transfer and organic semiconductor research, a previously unreported polymorph of F4TCNQ was grown concomitantly with the known polymorph from a saturated solution of dichloromethane. The structure was elucidated using single-crystal X-ray diffraction and it was found that the new polymorph packs with molecules in parallel layers, in a similar manner to the layered structure of F2TCNQ. The structure was analysed using Hirshfeld surface analysis, fingerprint plots and pairwise interaction energies, and compared to existing data. The structure of a toluene solvate of F4TCNQ is also reported.

