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Updated: Oct 29, 2025

Examining Local Network Processing using Multi-contact Laminar Electrode Recording
Published on: September 8, 2011
M Terzi1, L Chehami1, M Farin2
1Université de Lille, Centre National de la Recherche Scientifique, Centrale Lille, Université Polytechnique Hauts-de-France, Unité Mixte de Recherche 8520, Institut d'Électronique de Microélectronique et de Nanotechnologie, F-59000 Lille, France.
This study introduces a new, baseline-free method to find surface contact defects in thin plates. The technique uses nonlinear wave interactions and advanced imaging to accurately locate flaws without prior data.
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